Pulse Duration as the Gatekeeper of Temporal Resolution in Ultrafast Measurements of Electron Dynamics

Authors

  • Kerem Uzer Independent Researcher Author
  • Cemil Akdoğan Gaziantep University, Department of Engineering Physics, Turkey Author

DOI:

https://doi.org/10.26417/1y8ha744

Keywords:

Ultrafast laser systems, electron dynamics, temporal resolution, pulse duration, pump-probe spectroscopy, timing jitter, attosecond physics, time-energy uncertainty.

Abstract

This extended essay investigates the critical role of pulse duration in ultrafast laser systems and its influence on the temporal resolution of measurements regarding attosecond and femtosecond-scale electron dynamics. While the fundamental premise suggests that shortening pulse duration allows scientists to "freeze" electron motion, this research demonstrates that realized experimental resolution is not defined by pulse width alone. Instead, effective temporal resolution Δtₑff emerges from a complex quadrature sum of independent variables, including pump and probe durations, arrival-time jitter, and instrument response timing. Through a synthesis of theoretical frameworks—such as the time-energy uncertainty principle and the Fourier limit—and an analysis of techniques like tr-ARPES and Ultrafast Electron Diffraction (UED), the study highlights the inevitable trade-offs between temporal precision and energy resolution. The findings indicate that while pulse duration establishes the theoretical lower bound of resolution, practical advancement requires system-level engineering focused on synchronization and jitter suppression rather than pulse compression alone. Ultimately, the essay argues that achieving high-fidelity measurement is less about minimizing a single parameter and more about managing the total instrument function to accurately resolve the causal history of electronic processes.

Published

2025-06-28

How to Cite

Pulse Duration as the Gatekeeper of Temporal Resolution in Ultrafast Measurements of Electron Dynamics. (2025). European Journal of Formal Sciences and Engineering, 8(1), 31-42. https://doi.org/10.26417/1y8ha744